XPS

XPS analysis can be used to quantitatively determine the chemical composition of the top 5‑10 nm of a surface. All elements except hydrogen and helium can be detected non-destructively and their oxidation or bonding states can be determined.

The method is based on irradiating the sample with X‑rays, which excites electrons and allows them to escape. Their number and energy provide information on the composition and bonding states. Depending on the measuring time and element, the detection limit of the method is around 0.1‑0.3 at%, which corresponds to around 1‑3 ng/cm².

Our XPS device is equipped with a large sample holder, a monochromatic AlKα X‑ray source, argon ion sputtering, a charge neutralizer, a hemispherical analyzer and a 2D detector, which allows the parallel acquisition of element distribution images with a lateral resolution of up to 20 μm. This is a particular strength of this instrument.

ISO 14606
ISO 15472
ISO 19318
ISO 20903
ASTM E1078

Quality assurance: Cleanliness of surfaces
Analysis of discolorations / stains / impurities
Analysis of chemical surface modifications
Analysis of coatings

Trace analysis: Identification of chromium-6 / Cr(VI)
Determination of the surface composition of medical devices (organic as well as inorganic substances), as recommended in ISO 10993-18 and ASTM F2847.

Small measuring ranges of Ø 15, 27, 55 or 110 μm for analyzing spots or small structures on the surface.
Detailed spectra for more precise chemical analysis of selected elements.
Angle-resolved measurement of tilted samples to determine the depth distribution in the uppermost 10 nm.
Depth profile of sputtered areas to determine the depth distribution between 10 nm and 1 μm.
Imaging XPS element distribution images or images of oxidation states with a lateral resolution of up to 20 μm.
Contact us for further possibilities.

For which samples is the method suitable?

We can analyze all vacuum-resistant metallic (including magnetic) and non-metallic solids and powders.

What do I need to bear in mind with the samples?

Specimen specifications:

Sample diameter max. 100 mm, height max. 20 mm. Larger samples can be crushed
Cleanly packed, we recommend in aluminum foil

How many measuring points should be analyzed?

We generally recommend 3 measurements, e.g. 3 measurements on one spot and 3 next to it as a reference. This ensures that the results are statistically relevant.