SEM/EDX

Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray spectroscopy (EDX) in combination offer a wide range of possibilities for the analysis and characterization of materials. They are ideal for determining the topography and structure of surfaces and fracture surfaces, with a magnification of up to 300,000×. We also have the option of analyzing samples at higher pressures, which allows us to analyze delicate, non-conductive samples without prior coating.

EDX spectroscopy offers the possibility to combine the SEM images with a determination of the elmentary composition and thus to visualize the chemical composition. Another example is particle analysis, in which the shape and composition of each individual particle can be determined.

For which samples is the method suitable?

We can analyze all vacuum-resistant, metallic and non-metallic solids (e.g. polymers, ceramics) and powders.

The VP mode (reduced vacuum) allows the analysis of non-conductive samples without sputtering or metallization.

What do I need to bear in mind with the samples?

The maximum sample size (W × D × H): is 100 × 100 × 50 mm, larger samples are also possible in special cases.
Only a few particles are needed for powder samples.
Samples are best packed in e.g. clean aluminum foil or a clean container.

What is the measuring range?

Magnifications from 5× up to 300,000× are possible.

EDX allows for quantification of most elements with a detection limit of approx. 0.4 ‑ 0.5 % for elements lighter than Al and 0.2 ‑ 0.3 % for those heavier than Al. The lateral resolution and the depth of information are approx. 1 μm each.

I would like to be there when you watch my samples in the REM. Is that possible?

Yes, you are welcome to be present during the SEM investigations. This facilitates communication and allows for situational responses to the investigation results, which often has a positive impact on the quality of the results.