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[Meet the Expert] conference

Materials and Surface Technology for Implants

3 min. Lesezeit

MtE banner_1500x521We are pleased to invite you to the 13th [MEET THE EXPERT] Implants Conference, entitled "Materials and Surface Technology for Implants"

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The conference will take place on November 5, 2024 in the concert hall in Solothurn (CH)

It serves as a platform for experts from across the spectrum of the implant sector, including research, clinical practice and industry, to come together and share insights.

Registrations for participants or table exhibitors will be accepted on the [MEET THE EXPERT] page.

 

We look forward to seeing you!
RMS Foundation

 

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Our certifications

Since 1995, the services of our materials testing laboratory have been accredited according to ISO/IEC 17025. Our QM system is ISO 9001 certified.
NEWS

Latest news

Here you will find our latest blog posts.
IL-5: Is the strength sufficient – is the deformation permissible?
IL-5: Is the strength sufficient – is the deformation permissible?
Mechanical tests in the RMS The RMS has a broad experience in static and quasistatic tests under tensile, compressive, bending or torsional loads as...
IL-4: Chemical surface analysis with XPS
IL-4: Chemical surface analysis with XPS
The X-ray photoelectron spectroscopy, short XPS, utilises the photoelectrical effect (figure 1): X-rays are used to excite the electrons in a...
IL-2: Do you know the fatigue strength of your components?
IL-2: Do you know the fatigue strength of your components?
The RMS has a series of appliances at its disposal. Among them are those for the uniaxial and multiaxial dynamic testing of material specimens,...
IL-16: Cleanliness of medical devices
IL-16: Cleanliness of medical devices
The scientists of the RMS Foundation focused for many years on the toxicological assessment of biomaterials only. While biocompatibility assessments...
IL-6: Scanning Electron Microscope (SEM) and chemical analysis (EDX)
IL-6: Scanning Electron Microscope (SEM) and chemical analysis (EDX)
In the scanning electron microscopy, we use a focussed electron beam to scan the surface of a specimen in vacuo. This emits the secondary electrons...
IL-7: Scanning Electron Microscopy (SEM) and application fields
IL-7: Scanning Electron Microscopy (SEM) and application fields
As a special possibility, the SEM of the RMS Foundation offers the three-dimensional recording and depiction of surfaces as well as the calculation...
IL-10: Contact Angle Measurements in the RMS Foundation
IL-10: Contact Angle Measurements in the RMS Foundation
The contact angle of a drop on a surface strongly depends on the chemistry of the surface and on the test liquid: If both are polar (e.g. a water...
IL-11: Surface analysis of a medical instrument
IL-11: Surface analysis of a medical instrument
The discoloured surface of the forceps couldn’t be removed with an acid pickling process and was only with mechanical grinding to remove, what cannot...
IL-15: Notch impact test: Measurement of the charpy impact toughness
IL-15: Notch impact test: Measurement of the charpy impact toughness
Products like surgical instruments (rasps, impactors, etc.) may be subjected to hammer strokes depending on the specific application. Therefore, they...
IL-17: Particle Size Analysis by Laser Diffraction
IL-17: Particle Size Analysis by Laser Diffraction
Principle: The static light scattering (laser diffraction) is a simple and fast measurement principle. The sample (powder, particles, etc.) passes a...
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RMS Foundation
Bischmattstrasse 12
2544 Bettlach
Switzerland

Phone +41 32 644 2000
E-Mail
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