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RMS Foundation

RMS Foundation

[Meet the Expert] conference

2 min read
We are pleased to invite you to the 13th [MEET THE EXPERT] Implants Conference, entitled "Materials and Surface Technology for Implants" .

Honorary doctorate for Marc Bohner

1 min read
In January 2024, Dr. Marc Bohner received an honorary doctorate from the RMS Foundation. Marc Bohner, Head of Research at the RMS Foundation, received …

IL-40: Testing of packaging

8 min read
RMS Foundation offers the following tests and examinations Visual inspection (ASTM F1886/F1886M): The seals are visually inspected for their uniformit …
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Our certifications

Since 1995, the services of our materials testing laboratory have been accredited according to ISO/IEC 17025. Our QM system is ISO 9001 certified.
NEWS

Latest news

Here you will find our latest blog posts.
IL-5: Is the strength sufficient – is the deformation permissible?
IL-5: Is the strength sufficient – is the deformation permissible?
Mechanical tests in the RMS The RMS has a broad experience in static and quasistatic tests under tensile, compressive, bending or torsional loads as...
IL-4: Chemical surface analysis with XPS
IL-4: Chemical surface analysis with XPS
The X-ray photoelectron spectroscopy, short XPS, utilises the photoelectrical effect (figure 1): X-rays are used to excite the electrons in a...
IL-2: Do you know the fatigue strength of your components?
IL-2: Do you know the fatigue strength of your components?
The RMS has a series of appliances at its disposal. Among them are those for the uniaxial and multiaxial dynamic testing of material specimens,...
IL-16: Cleanliness of medical devices
IL-16: Cleanliness of medical devices
The scientists of the RMS Foundation focused for many years on the toxicological assessment of biomaterials only. While biocompatibility assessments...
IL-6: Scanning Electron Microscope (SEM) and chemical analysis (EDX)
IL-6: Scanning Electron Microscope (SEM) and chemical analysis (EDX)
In the scanning electron microscopy, we use a focussed electron beam to scan the surface of a specimen in vacuo. This emits the secondary electrons...
IL-7: Scanning Electron Microscopy (SEM) and application fields
IL-7: Scanning Electron Microscopy (SEM) and application fields
As a special possibility, the SEM of the RMS Foundation offers the three-dimensional recording and depiction of surfaces as well as the calculation...
IL-10: Contact Angle Measurements in the RMS Foundation
IL-10: Contact Angle Measurements in the RMS Foundation
The contact angle of a drop on a surface strongly depends on the chemistry of the surface and on the test liquid: If both are polar (e.g. a water...
IL-11: Surface analysis of a medical instrument
IL-11: Surface analysis of a medical instrument
The discoloured surface of the forceps couldn’t be removed with an acid pickling process and was only with mechanical grinding to remove, what cannot...
IL-15: Notch impact test: Measurement of the charpy impact toughness
IL-15: Notch impact test: Measurement of the charpy impact toughness
Products like surgical instruments (rasps, impactors, etc.) may be subjected to hammer strokes depending on the specific application. Therefore, they...
IL-17: Particle Size Analysis by Laser Diffraction
IL-17: Particle Size Analysis by Laser Diffraction
Principle: The static light scattering (laser diffraction) is a simple and fast measurement principle. The sample (powder, particles, etc.) passes a...
CONTACT

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RMS Foundation
Bischmattstrasse 12
2544 Bettlach
Switzerland

Phone +41 32 644 2000
E-Mail
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